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Karthik Pattabiraman, Wu-chun Feng, and Daniel A Reed (2003)

Profile-Based Dynamic Voltage Scaling for I/O-Intensive Codes

LACSI Symposium, Sante Fe, New Mexico.

Note

Poster presentation

by admin — last modified 2007-12-10 21:05

Copyright © 2003-2010 Los Alamos Computer Science Institute (LACSI),
Rice University, MS 41, 6100 Main Street, Houston, TX 77005.

This material is based on work supported by the Department of Energy under Contract
Nos. 03891-001-99-4G, 74837-001-03 49, 86192-001-04 49, and/or 12783-001-05 49
from the Los Alamos National Laboratory.

Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s)
and do not necessarily reflect the views of the Los Alamos National Laboratory or the Department of Energy.

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